Simulation of a Superconductor Fault Current Limiter with finite element method using A-V-H formulation

Gabriel dos Santos; Flávio Goulart dos Reis Martins; Bárbara  Maria Oliveira Santos; Daniel  Henrique Nogueira Dias; Guilherme  Gonçalves Sotelo; Felipe  Sass

doi:10.48011/sbse.v1i1.2229

Gabriel dos Santos Universidade Federal do Rio de Janeiro, Universidade Federal Fluminense
Flávio Goulart dos Reis Martins Universidade Federal do Rio de Janeiro, Universidade Federal Fluminense
Bárbara Maria Oliveira Santos Universidade Federal do Rio de Janeiro, Universidade Federal Fluminense
Daniel Henrique Nogueira Dias Universidade Federal do Rio de Janeiro, Universidade Federal Fluminense
Guilherme Gonçalves Sotelo Universidade Federal do Rio de Janeiro, Universidade Federal Fluminense
Felipe Sass Universidade Federal do Rio de Janeiro, Universidade Federal Fluminense

DOI: https://doi.org/10.48011/sbse.v1i1.2229

Keywords: Superconducting fault current limiting, SFCL, Saturated core fault current limiting, Short circuit, Finite element method, A-V formulation, H-formulation

Abstract

Nowadays, the complexity of electrical power systems is increasing. Consequently, the occurrence and the amplitude of the fault current are rising. This fault currents harm the substations’ electrical equipment. Besides, the growth in the fault current level is forcing the change of the circuit breakers to others with a higher interruption capability. A proposal to solve this problem is the fault current limiter (FCL). This equipment has low impedance in the normal operation and high impedance in a short circuit moment. Superconductors are an advantageous choice of material in this case, because of their properties. In order to simulate this equipment, the 2-D Finite Element Method (FEM) has been used. In this paper, a novel FEM simulation analysis of the saturated core Superconductor Fault Current Limiter (SFCL) is proposed using the A-V-H formulation. The current distribution in the superconducting coil is observed. The results are compared to the limited fault current measurements and simulations available in the literature.